ics Institute of Computer Science
The Czech Academy of Sciences
Department of Artificial Intelligence
Rosenbrock

Ctirad Matonoha

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Numerically Optimized Design

    Numerically Optimized Design (NOD) is a Fortran-based numerical spatial statistical design optimization system for 2D correlated data on arbitrary domain that is discretized via fine equidistant grid. The user supplies the grid covering the domain (containing spatial coordinates and relevant covariates in appropriate matrices), the set of existing measurement points (containing only spatial coordinates), and covariance parameters. The system then finds optimal placement of a new measurement point with respect to the minimax criterion (minimizing the maximum Kriging spatial prediction variance in the grid by the placement). This criterion arises naturally when considering spatial interpolation (and subsequent mapping) of a measured quantity within the area from a finite set of measurements of a given variable (e.g., a concentration of air pollutant). Map/interpolation quality is then quantified by Kriging variances at all grid points and the worst case is represented by the maximum to be minimized. While the maximum is always evaluated over the whole grid, the actual measurement placement can be further restricted by the user-supplied vector of admissibility indicators (1/0 variables indicating whether a given grid point is or is not admissible for a new measurement placement, e.g. through practical/logistical or other considerations).

    Searching for the optimal location of more measurement points can be performed by subsequent update of input files and repeated execution of the main program.

    This work has been supported from the ARAMIS (SS02030031) project funded by the Czech Technology Agency.

Aramis

Authors: Ctirad Matonoha (matonoha@cs.cas.cz), Marek Brabec (mbrabec@cs.cas.cz)

Paper: Brabec M., Matonoha C.: in preparation.

The main file:

Structure of input files:

Structure of output files:

How to use the software:

Example:

Licence:

MIT License

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